Workstation for Laser Testing of Single Event Effects (SEE) on Radiation Hardened Semiconductor

Category: Characterization > Inspection > Others
Reference # : Model No :

A compact pulsed laser system for simulating Single Event Effects (SEE) in integrated circuits. With a fast repetition rate and precise control, the system targets specific IC areas with 50nm precision or less.

Benefits

Provides quick access, reducing travel costs, and expediting Commercial Off-The-Shelf (COTS) product selection. Whether purchased or rented ($4000/week), it offers a fast lead time (8-10 weeks) and preserves intellectual property.

Limitations

The 8-10 week lead time may not suit urgent testing needs, and the system is primarily tailored for space, military, and aerospace applications.

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A view of the Workstation

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